This paper describes an application of infrared light-induced de-polarization applied on a\npolarized CdZnTe detector working under high radiation fluxes. We newly demonstrate the influence\nof a high flux of X-rays and simultaneous 1200-nm LED illumination on the spectroscopic properties\nof a CdZnTe detector. CdZnTe detectors operating under high radiation fluxes usually suffer from\nthe polarization effect, which occurs due to a screening of the internal electric field by a positive\nspace charge caused by photogenerated holes trapped at a deep level. Polarization results in the\ndegradation of detector charge collection efficiency. We studied the spectroscopic behavior of CdZnTe\nunder various X-ray fluxes ranging between 5 Ã?â?? 105 and 8 Ã?â?? 106 photons per mm2 per second. It was\nobserved that polarization occurs at an X-ray flux higher than 3Ã?â??106 mmâË?â??2Ã?·sâË?â??1. Using simultaneous\nillumination of the detector by a de-polarizing LED at 1200 nm, it was possible to recover X-ray\nspectra originally deformed by the polarization effect.
Loading....